Inherited redundancy and configurability utilization for repairing nanowire crossbars with clustered defects

Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

Volumn , Issue , 2006, Pages 98-106

  Yellambalase, Yadunandana ^a   Choi, Minsu ^a   Kim, Yong Bin ^b  

^a MISSOURI UNIVERSITY OF SCIENCE AND TECHNOLOGY   (United States)

^b NORTHEASTERN UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTER SIMULATION; CROSSBAR EQUIPMENT; DEFECTS; PHOTOLITHOGRAPHY; REDUNDANCY;

DEFECT-TOLERANCE; NANOMETER-SCALE ELEMENTS; NANOWIRE CROSSBAR STRUCTURE; RECONFIGURABLE SYSTEMS;

NANOWIRES;

EID: 38749094114     PISSN: 15505774     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DFT.2006.37     Document Type: Conference Paper

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