메뉴 건너뛰기




Volumn 74, Issue 6, 2007, Pages 1276-1281

On the stoney formula for a thin film/substrate system with nonuniform substrate thickness

Author keywords

Interfacial shears; Nonlocal stress curvature relations; Nonuniform misfit strain; Nonuniform substrate thickness; Thin films

Indexed keywords

INTERFACIAL SHEARS; NONLOCAL STRESS-CURVATURE RELATIONS; NONUNIFORM MISFIT STRAIN; NONUNIFORM SUBSTRATE THICKNESS;

EID: 38049150813     PISSN: 00218936     EISSN: None     Source Type: Journal    
DOI: 10.1115/1.2745392     Document Type: Article
Times cited : (116)

References (18)
  • 1
    • 0000073841 scopus 로고
    • The Tension of Metallic Films Deposited by Electrolysis
    • Stoney, G. G., 1909, "The Tension of Metallic Films Deposited by Electrolysis," Proc. R. Soc. London, Ser. A, 82, pp. 172-175.
    • (1909) Proc. R. Soc. London, Ser. A , vol.82 , pp. 172-175
    • Stoney, G.G.1
  • 3
    • 0032644329 scopus 로고    scopus 로고
    • Thermoelastic Analysis of Periodic Thin Lines Deposited on a Substrate
    • Wikstrom, A., Gudmundson, P., and Suresh, S., 1999, "Thermoelastic Analysis of Periodic Thin Lines Deposited on a Substrate," J. Mech. Phys. Solids, 47, pp. 1113-1130.
    • (1999) J. Mech. Phys. Solids , vol.47 , pp. 1113-1130
    • Wikstrom, A.1    Gudmundson, P.2    Suresh, S.3
  • 4
    • 3242854332 scopus 로고    scopus 로고
    • Analysis of AverageThermal Stresses in Passivated Metal Interconnects
    • Wikstrom, A., Gudmundson, P., and Suresh, S., 1999, "Analysis of AverageThermal Stresses in Passivated Metal Interconnects," J. Appl. Phys., 86, pp. 6088-6095.
    • (1999) J. Appl. Phys , vol.86 , pp. 6088-6095
    • Wikstrom, A.1    Gudmundson, P.2    Suresh, S.3
  • 5
    • 3743109337 scopus 로고    scopus 로고
    • Stresses, Curvatures, and Shape Changes Arising From Patterned Lines on Silicon Wafers
    • Shen, Y. L., Suresh, S., and Blech, I. A., 1996, "Stresses, Curvatures, and Shape Changes Arising From Patterned Lines on Silicon Wafers," J. Appl. Phys., 80, pp. 1388-1398.
    • (1996) J. Appl. Phys , vol.80 , pp. 1388-1398
    • Shen, Y.L.1    Suresh, S.2    Blech, I.A.3
  • 6
    • 0034225053 scopus 로고    scopus 로고
    • Effects of Line and Passivation Geometry on Curvature Evolution During Processing and Thermal Cycling in Copper Interconnect Lines
    • Park, T. S., and Suresh, S., 2000, "Effects of Line and Passivation Geometry on Curvature Evolution During Processing and Thermal Cycling in Copper Interconnect Lines," Acta Mater., 48, pp. 3169-3175.
    • (2000) Acta Mater , vol.48 , pp. 3169-3175
    • Park, T.S.1    Suresh, S.2
  • 7
    • 0027609996 scopus 로고
    • Geometrically Nonlinear Stress-Deflection Relations for Thin Film/Substrate Systems
    • Masters, C. B., and Salamon, N. J., 1993, "Geometrically Nonlinear Stress-Deflection Relations for Thin Film/Substrate Systems," Int. J. Eng. Sci., 31, pp. 915-925.
    • (1993) Int. J. Eng. Sci , vol.31 , pp. 915-925
    • Masters, C.B.1    Salamon, N.J.2
  • 8
    • 0029255919 scopus 로고
    • Bifurcation in Isotropic Thin Film/Substrate Plates
    • Salamon, N. J., and Masters, C. B., 1995, "Bifurcation in Isotropic Thin Film/Substrate Plates," Int. J. Solids Struct., 32, pp. 473-481.
    • (1995) Int. J. Solids Struct , vol.32 , pp. 473-481
    • Salamon, N.J.1    Masters, C.B.2
  • 9
    • 0001474498 scopus 로고    scopus 로고
    • Large Deformation and Geometric Instability of Substrates With Thin-Film Deposits
    • Finot, M., Blech, I. A., Suresh, S., and Fijimoto, H., 1997, "Large Deformation and Geometric Instability of Substrates With Thin-Film Deposits," J. Appl. Phys., 81, pp. 3457-3464.
    • (1997) J. Appl. Phys , vol.81 , pp. 3457-3464
    • Finot, M.1    Blech, I.A.2    Suresh, S.3    Fijimoto, H.4
  • 10
    • 0033907470 scopus 로고    scopus 로고
    • Substrate Curvature Due to Thin Film Mismatch Strain in the Nonlinear Deformation Range
    • Freund, L. B., 2000, "Substrate Curvature Due to Thin Film Mismatch Strain in the Nonlinear Deformation Range," J. Mech. Phys. Solids, 48, p. 1159.
    • (2000) J. Mech. Phys. Solids , vol.48 , pp. 1159
    • Freund, L.B.1
  • 11
    • 0035356845 scopus 로고    scopus 로고
    • Full Field Optical Measurement of Curvatures in Ultra-Thin Film/Substrate Systems in the Range of Geometrically Nonlinear Deformations
    • Lee, H., Rosakis, A. J., and Freund, L. B., 2001, "Full Field Optical Measurement of Curvatures in Ultra-Thin Film/Substrate Systems in the Range of Geometrically Nonlinear Deformations," J. Appl. Phys., 89, pp. 6116-6129.
    • (2001) J. Appl. Phys , vol.89 , pp. 6116-6129
    • Lee, H.1    Rosakis, A.J.2    Freund, L.B.3
  • 12
    • 0034225053 scopus 로고    scopus 로고
    • Effects of Line and Passivation Geometry on Curvature Evolution During Processing and Thermal Cycling in Copper Interconnect Lines
    • Park, T. S., and Suresh, S., 2000, "Effects of Line and Passivation Geometry on Curvature Evolution During Processing and Thermal Cycling in Copper Interconnect Lines," Acta Mater., 48, pp. 3169-3175.
    • (2000) Acta Mater , vol.48 , pp. 3169-3175
    • Park, T.S.1    Suresh, S.2
  • 13
    • 26644459742 scopus 로고    scopus 로고
    • Non-Uniform, Axisymmetric Misfit Strain: In Thin Films Bonded on Plate Substrates/Substrate Systems: The Relation Between Non-Uniform Film Stresses and System Curvatures
    • Huang, Y., Ngo, D., and Rosakis, A. J., 2005, "Non-Uniform, Axisymmetric Misfit Strain: In Thin Films Bonded on Plate Substrates/Substrate Systems: The Relation Between Non-Uniform Film Stresses and System Curvatures," Acta Mech. Sin., 21, pp. 362-370.
    • (2005) Acta Mech. Sin , vol.21 , pp. 362-370
    • Huang, Y.1    Ngo, D.2    Rosakis, A.J.3
  • 14
    • 24944573870 scopus 로고    scopus 로고
    • Extension of Stoney's Formula to Non-Uniform Temperature Distributions in Thin Film/Substrate Systems. The Case of Radial Symmetry
    • Huang, Y., and Rosakis, A. J., 2005, "Extension of Stoney's Formula to Non-Uniform Temperature Distributions in Thin Film/Substrate Systems. The Case of Radial Symmetry," J. Mech. Phys. Solids, 53, pp. 2483-2500.
    • (2005) J. Mech. Phys. Solids , vol.53 , pp. 2483-2500
    • Huang, Y.1    Rosakis, A.J.2
  • 15
    • 33750823996 scopus 로고    scopus 로고
    • Spatially Non-Uniform, Isotropic Misfit Strain in Thin Films Bonded on Plate Substrates: The Relation Between Non-Uniform Film Stresses and System Curvatures
    • Ngo, D., Huang, Y., Rosakis, A. J., and Feng, X., 2006, "Spatially Non-Uniform, Isotropic Misfit Strain in Thin Films Bonded on Plate Substrates: The Relation Between Non-Uniform Film Stresses and System Curvatures," Thin Solid Films, 515, pp. 2220-2229.
    • (2006) Thin Solid Films , vol.515 , pp. 2220-2229
    • Ngo, D.1    Huang, Y.2    Rosakis, A.J.3    Feng, X.4
  • 16
    • 42649118938 scopus 로고    scopus 로고
    • Feng, X., Huang, Y., Jiang. H., Ngo, D., and Rosakis, A. J., 2006, The Effect of Thin Film/Substrate Radii on the Stoney Formula for Thin Film/Substrate Subjected to Non-Uniform Axisymmetric Misfit Strain and Temperature, J. Mech. Mater. Struct., in press.
    • Feng, X., Huang, Y., Jiang. H., Ngo, D., and Rosakis, A. J., 2006, "The Effect of Thin Film/Substrate Radii on the Stoney Formula for Thin Film/Substrate Subjected to Non-Uniform Axisymmetric Misfit Strain and Temperature," J. Mech. Mater. Struct., in press.
  • 17
    • 33846533039 scopus 로고    scopus 로고
    • Thin Film/Substrate Systems Featuring Arbitrary Film Thickness and Misfit Strain Distributions. Part II: Experimental Validation of the Non-Local Stress/Curvature Relations
    • Brown, M., Rosakis, A. J., Feng, X., Feng, X., Huang, Y., and Üstündag, E., 2006, "Thin Film/Substrate Systems Featuring Arbitrary Film Thickness and Misfit Strain Distributions. Part II: Experimental Validation of the Non-Local Stress/Curvature Relations," Int. J. Solids Struct., 44, pp. 1755-1767.
    • (2006) Int. J. Solids Struct , vol.44 , pp. 1755-1767
    • Brown, M.1    Rosakis, A.J.2    Feng, X.3    Feng, X.4    Huang, Y.5    Üstündag, E.6
  • 18
    • 33748413935 scopus 로고    scopus 로고
    • A Comparison of X-Ray Microdiffraction and Coherent Gradient Sensing in Measuring Discontinuous Curvatures in Thin Film: Substrate Systems
    • Brown, M. A., Park, T. S., Rosakis, A. J., Ustundag, E., Huang, Y., Tamura, N., and Valek, B., 2006, "A Comparison of X-Ray Microdiffraction and Coherent Gradient Sensing in Measuring Discontinuous Curvatures in Thin Film: Substrate Systems," ASME J. Appl. Mech., 73, pp. 723-729.
    • (2006) ASME J. Appl. Mech , vol.73 , pp. 723-729
    • Brown, M.A.1    Park, T.S.2    Rosakis, A.J.3    Ustundag, E.4    Huang, Y.5    Tamura, N.6    Valek, B.7


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.