Non-uniform, axisymmetric misfit strain: in thin films bonded on plate substrates/substrate systems: The relation between non-uniform film stresses and system curvatures

Acta Mechanica Sinica/Lixue Xuebao

Volumn 21, Issue 4, 2005, Pages 362-370

  Huang, Yonggang ^a   Ngo, D ^a   Rosakis, A J ^b  

^a United States of America   (United States)

^b CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Interfacial shear; Non local effect; Non uniform misfit strain; Non uniform wafer curvatures; Stress curvature relation

Indexed keywords

BONDING; BOUNDARY CONDITIONS; INTERFACES (MATERIALS); MEASUREMENTS; PLATES (STRUCTURAL COMPONENTS); STRAIN; STRESSES; SUBSTRATES; TRACTION (FRICTION);

INTERFACIAL SHEAR; NONLOCAL EFFECT; NONUNIFORM MISFIT STRAIN; NONUNIFORM WAFER CURVATURE; STRESS CURVATURE RELATION;

THIN FILMS;

EID: 26644459742     PISSN: 05677718     EISSN: None     Source Type: Journal    
DOI: 10.1007/s10409-005-0051-9     Document Type: Article

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