Structural characterization of TiO2 films grown on LaAlO3 and SrTiO3 substrates using reactive molecular beam epitaxy

Journal of Crystal Growth

Volumn 310, Issue 3, 2008, Pages 545-550

  Weng, X ^a   Fisher, P ^b   Skowronski, M ^b   Salvador, P A ^b   Maksimov, O ^a  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

^b CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

A1. Electron Energy Loss Spectrometry; A1. Transmission Electron Microscopy; A3. Molecular Beam Epitaxy; B1. TiO2

Indexed keywords

ELECTRON ENERGY LOSS SPECTROSCOPY; MOLECULAR BEAM EPITAXY; MOLECULAR STRUCTURE; SUBSTRATES; TITANIUM DIOXIDE; TRANSMISSION ELECTRON MICROSCOPY;

CRYSTALLOGRAPHIC ORIENTATION; HETEROEPITAXIAL BUFFER LAYERS; INTERFACIAL PHASES;

FILM GROWTH;

EID: 37849026018     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2007.10.084     Document Type: Article

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