Characterization of short-wavelength-selective a-Si:H MSM photoconductors for large-area digital-imaging applications

IEEE Transactions on Electron Devices

Volumn 55, Issue 1, 2008, Pages 337-342

  Taghibakhsh, Farhad ^a   Khodami, Ida ^a   Karim, Karim S ^a  

^a UNIVERSITY OF WATERLOO   (Canada)

Author keywords

Amorphous silicon (a Si); Metal semiconductor metal (MSM) devices; Photoconducting devices; Photodetectors

Indexed keywords

AMORPHOUS SILICON; IMAGE PROCESSING; PHOTOCURRENTS; PHOTODETECTORS; PHOTODIODES; QUANTUM EFFICIENCY; SEMICONDUCTING SILICON; THIN FILM TRANSISTORS;

DIGITAL IMAGING; METAL-SEMICONDUCTOR-METAL DEVICES;

PHOTOCONDUCTING MATERIALS;

EID: 37749010821     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2007.911094     Document Type: Article

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