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Volumn 18, Issue 8, 1997, Pages 397-399

High mobility tri-layer a-Si:H thin-film transistors with ultrathin active layer

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR DEVICE STRUCTURES; ULTRATHIN FILMS;

EID: 0031210697     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/55.605452     Document Type: Article
Times cited : (4)

References (8)
  • 1
    • 0029521643 scopus 로고
    • Limitations and prospects of a-Si:H TFTs
    • Dec.
    • W. E. Howard, "Limitations and prospects of a-Si:H TFTs," J. Soc. Inform. Display, vol. 3, no. 3, pp. 127-132, Dec. 1995.
    • (1995) J. Soc. Inform. Display , vol.3 , Issue.3 , pp. 127-132
    • Howard, W.E.1
  • 2
    • 3643065454 scopus 로고
    • a-Si TFT technologies for large-size and high-pixel-density AM-LCD's
    • N. Ibaraki, "a-Si TFT technologies for large-size and high-pixel-density AM-LCD's," in Proc. IUMRS-ICEM'94 Symp., 1994, vol. 3, pp. 523-533.
    • (1994) Proc. IUMRS-ICEM'94 Symp. , vol.3 , pp. 523-533
    • Ibaraki, N.1
  • 5
    • 0024884488 scopus 로고
    • The effect of interface states on amorphous-silicon transistors
    • Dec.
    • N. Ibaraki, K. Fukuda, and H. Takata, "The effect of interface states on amorphous-silicon transistors," IEEE Trans. Electron Devices, vol. 36, pp. 2971-2972, Dec. 1989.
    • (1989) IEEE Trans. Electron Devices , vol.36 , pp. 2971-2972
    • Ibaraki, N.1    Fukuda, K.2    Takata, H.3
  • 6
    • 0344820512 scopus 로고
    • Simulations of short-channel and overlap effects in amorphous silicon thin-film transistors
    • Mar.
    • J. G. Shaw and M. Hack, "Simulations of short-channel and overlap effects in amorphous silicon thin-film transistors," J. Appl. Phys., vol. 65, no. 5, pp. 2124-2129, Mar. 1989.
    • (1989) J. Appl. Phys. , vol.65 , Issue.5 , pp. 2124-2129
    • Shaw, J.G.1    Hack, M.2
  • 8
    • 0030563439 scopus 로고    scopus 로고
    • Importance of first layer thickness on TFT characteristics using a-Si:H deposited by 2-step process
    • May
    • T. Kashiro, S. Kawamura, N. Imai, K. Fukuda, K. Matsumura, and N. Ibaraki, "Importance of first layer thickness on TFT characteristics using a-Si:H deposited by 2-step process," J. Non-Cryst. Solids, vol. 198-200, pt. 2, pp. 1130-1133, May 1996.
    • (1996) J. Non-Cryst. Solids , vol.198-200 , Issue.2 PART , pp. 1130-1133
    • Kashiro, T.1    Kawamura, S.2    Imai, N.3    Fukuda, K.4    Matsumura, K.5    Ibaraki, N.6


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.