Fabrication and characterization of nickel amorphous silicon metal-semiconductor-metal photoconductors

Canadian Conference on Electrical and Computer Engineering

Volumn , Issue , 2007, Pages 1664-1667

  Taghibakhsh, Farhad ^a   Karim, Karim S ^a  

^a SIMON FRASER UNIVERSITY   (Canada)

Author keywords

Amorphous silicon; MSM; Nickel; Photoconductor

Indexed keywords

DARK CURRENTS; ELECTRIC CONDUCTIVITY; METALS; NICKEL; NICKEL ALLOYS; NONMETALS; OPTICAL DESIGN; OPTOELECTRONIC DEVICES; PHOTODETECTORS; SEMICONDUCTING SILICON; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR MATERIALS; SILICON;

ELECTRICAL AND COMPUTER ENGINEERING (ECE); ELECTRICAL CHARACTERIZATIONS; METAL SEMICONDUCTOR METAL (MSM); METAL SEMICONDUCTOR METAL (MSM) PHOTODETECTORS;

AMORPHOUS SILICON;

EID: 37749017824     PISSN: 08407789     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CCECE.2007.416     Document Type: Conference Paper

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