An amorphous silicon photoconductor for UV detection

Materials Research Society Symposium - Proceedings

Volumn 762, Issue , 2003, Pages 211-216

  Hillebrand, Matthias ^a   Blecher, Frank ^b   Sterzel, Jürgen ^c   Böhm, Markus ^a  

^a UNIVERSITY OF SIEGEN   (Germany)

^b LambdaLab   (Germany)

^c Jena Optronik GmbH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; ELECTRIC FIELDS; ELECTRODES; IMAGE SENSORS; OPTIMIZATION; PASSIVATION; PHOTOCONDUCTING MATERIALS; RADIATION EFFECTS; SCINTILLATION; THIN FILMS; ULTRAVIOLET DETECTORS; VOLTAGE MEASUREMENT;

CONSTANT PHOTOCURRENT METHODS (CPM); MICROSYSTEM TECHNOLOGIES; WAVELENGTH DETECTION;

AMORPHOUS SILICON;

EID: 1642520702     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-762-a18.15     Document Type: Conference Paper

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