Compact soft x-ray spectrometer for plasma diagnostics at the Heidelberg Electron Beam Ion Trap

Review of Scientific Instruments

Volumn 78, Issue 12, 2007, Pages

  Lapierre, A ^a,b   Crespo Lopez Urrutia J R ^a   Baumann, T M ^a   Epp, S W ^a   Gonchar, A ^a   Gonzalez Martinez A J ^a   Liang, G ^a   Rohr, A ^a   Soria Orts, R ^a   Simon, M C ^a   Tawara, H ^a   Versteegen, R ^a   Ullrich, J ^a  

^a MAX PLANCK INSTITUT FÜR KERNPHYSIK   (Germany)

^b TRIUMF   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

CCD CAMERAS; CRYOGENICS; DIFFRACTION GRATINGS; ELECTRON BEAMS; ELECTRON TRAPS; PLASMA DIAGNOSTICS; SPECTRUM ANALYSIS;

COMPACT SOFT X RAY SPECTROMETERS; HEIDELBERG ELECTRON BEAM ION TRAPS; WAVELENGTH MEASUREMENTS;

X RAY SPECTROMETERS;

EID: 37649015518     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2818808     Document Type: Article

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