Accurate modeling of benchmark x-ray spectra from highly charged ions of tungsten

Physical Review A - Atomic, Molecular, and Optical Physics

Volumn 74, Issue 4, 2006, Pages

  Ralchenko, Yuri ^a   Tan, Joseph N ^a   Gillaspy, J D ^a   Pomeroy, Joshua M ^a   Silver, Eric ^b  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b HARVARD SMITHSONIAN CENTER FOR ASTROPHYSICS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRON BEAMS; ELECTRON ENERGY LEVELS; PLASMAS; TUNGSTEN; X RAY SPECTROSCOPY;

KINETIC SIMULATION; NON-MAXWELLIAN TUNGSTEN PLASMA; SPECTRAL LINES; TUNGSTEN IONS;

CHARGED PARTICLES;

EID: 33750456541     PISSN: 10502947     EISSN: 10941622     Source Type: Journal    
DOI: 10.1103/PhysRevA.74.042514     Document Type: Article

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