Absolute calibration of a flat field spectrometer in the wavelength range 10-70 Å

Review of Scientific Instruments

Volumn 69, Issue 5, 1998, Pages 1949-1954

  Saemann, A ^a   Eidmann, K ^a  

^a MAX PLANCK INSTITUT FÜR QUANTENOPTIK   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000851001     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1148878     Document Type: Article

References (13)

1. R. J. Fonck, A. T. Ramsey, and R. V. Yelle, Appl. Opt. 21, 2115 (1982).
2. T. Kita, T. Harada, N. Nakano, and H. Kuroda, Appl. Opt. 22, 512 (1983).
3. M. C. Hettrick, J. H. Underwood, P. J. Batson, and M. J. Eckart, Appl. Opt. 27, 200 (1988).
4. T. Harada and T. Kita, Appl. Opt. 19, 3987 (1980).
5. W. Schwanda, K. Eidmann, and M. C. Richardson, J. X-Ray Sci. Technol. 4, 8 (1993).
6. G. P. Kiehn, T. Garvey, R. A. Smith, O. Willi, A. R. Damerell, and J. West, Proc. SPIE 831, 150 (1988).
7. N. Nakano, H. Kuroda, T. Kita, and T. Harada, Appl. Opt. 23, 2386 (1984).
8. J. Edelstein, M. C. Hettrick, S. Mrowda, P. Jelinski, and C. Martin, Appl. Opt. 23, 3267 (1984).
9. Y. Li, G. D. Tsakiris, and R. Sigel, Rev. Sci. Instrum. 66, 80 (1995).
10. P. Kirkpatrick and A. V. Baez, J. Opt. Soc. Am. 38, 766 (1948).
11. W. C. Mead, E. K. Stover, R. L. Kauffman, H. N. Kornblum, and B. F. Lasinski, Phys. Rev. A 38, 5275 (1988).
12. K. Eidmann, and W. Schwanda, Laser Part. Beams 9, 551 (1991).
13. H. W. Schnopper, L. P. Van Speybroeck, J. P. Delvaille, A. Epstein, E. Källne, R. Z. Bachrach, J. Dijkstra, and L. Lantward, Appl. Opt. 16, 1088 (1977).