Flat-field grating spectrometer for high-resolution soft x-ray and extreme ultraviolet measurements on an electron beam Ion trap

Review of Scientific Instruments

Volumn 75, Issue 10 II, 2004, Pages 3723-3726

  Beiersdorfer, P ^a   Magee, E W ^a   Trabert E ^a   Chen, H ^a   Lepson, J K ^b   Gu, M F ^c   Schmidt, M ^a,d  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c STANFORD UNIVERSITY   (United States)

^d DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL SPECTROMETERS; EXTREME ULTRAVIOLET (EUV); GRAZING INCIDENCE GRATING SPECTROMETERS; LIVERMORE ELECTRON BEAM ION TRAPS;

DIFFRACTION GRATINGS; ELECTRON BEAMS; ELECTRON TRAPS; LIGHT POLARIZATION; LIGHT REFLECTION; OPTICAL RESOLVING POWER; ULTRAVIOLET RADIATION; X RAYS;

SPECTROMETERS;

EID: 9944245665     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1779609     Document Type: Conference Paper

References (32)

1. A. C. Brinkman et al., Astrophys. J. Lett. 530, L111 (2000).
2. C. R. Canizares et al., Astrophys. J. Lett. 539, L41 (2000).
3. F. Paerels et al., Astrophys. J. Lett. 533, L135 (2000).
4. A. C. Brinkman et al., Astron. Astrophys. 365, L324 (2001).
5. T. H. Marken et al., Proc. SPIE 2280, 168 (1994).
6. A. C. Brinkman et al., Proc. SPIE 3113, 181 (1997).
7. J. W. den Herder et al., Astron. Astrophys. 365, L7 (2001).
8. P. Beiersdorfer, Annu. Rev. Astron. Astrophys. 412, 343 (2003).
9. P. Beiersdorfer et al., Rev. Sci. Instrum. 70, 276 (1999).
10. S. B. Utter et al., Rev. Sci. Instrum. 70, 284 (1999).
11. R. Radtke et al., Phys. Rev. A 64, 012720 (2001).
12. P. Beiersdorfer and B. J. Wargelin, Rev. Sci. Instrum. 65, 13 (1994).
13. G. V. Brown, P. Beiersdorfer, and K. Widmann, Rev. Sci. Instrum. 70, 280 (1999).
14. J. L. Schwob, A. W. Wouters, S. Suckewer, and M. Finkenthal, Rev. Sci. Instrum. 58, 1601 (1987).
15. T. Kita, T. Harada, N. Nakano, and H. Kuroda, Appl. Opt. 22, 512 (1983).
16. Roper Scientific, 3660 Quakerbridge Road, Trenton, NJ 08619.
17. S. B. Utter, P. Beiersdorfer, J. R. Crespo López-Urrutia, and K. Widmann, Nucl. Instrum. Methods Phys. Res. A 428, 276 (1999).
18. P. Beiersdorfer, R. E. Marrs, J. R. Henderson, D. A. Knapp, M. A. Levine, D. B. Platt, M. B. Schneider, D. A. Vogel, and K. L. Wong, Rev. Sci. Instrum. 61, 2338 (1990).
19. J. R. Crespo López-Urrutia, P. Beiersdorfer, K. Widmann, and V. Decaux, Can. J. Phys. 80, 1687 (2002).
20. J. K. Lepson, P. Beiersdorfer, E. Behar, and S. M. Kahn, Astrophys. J. 590, 604 (2003).
21. Scanalytics, 8550 Lee Highway Suite 400, Fairfax, VA 22031.
22. T. R. Ayres et al., Astrophys. J. 549, 554 (2001).
23. P. Beiersdorfer et al., Rev. Sci. Instrum. 68, 1077 (1997).
24. P. Beiersdorfer et al., Rev. Sci. Instrum. 68, 1073 (1997).
25. A. S. Shlyaptseva, R. C. Mancini, P. Neill, and P. Beiersdorfer, Rev. Sci. Instrum. 68, 1095 (1997).
26. P. Beiersdorfer, L. Schweikhard, J. Crespo López-Urrutia, and K. Widmann, Rev. Sci. Instrum. 67, 3818 (1996).
27. E. Träbert, Can. J. Phys. 80, 1481 (2002).
28. E. Träbert and P. Beiersdorfer, Rev. Sci. Instrum. 74, 2127 (2003).
29. P. Beiersdorfer et al. Rev. Sci. Instrum. 72, 508 (2001).
30. M. Schmidt et al., Astrophys. J. 604, 562 (2004).
31. M.-F Gu, Astrophys. J. 582, 1241 (2003).
32. R. K. Smith and N. S. Brickhouse, Rev. Mex. Astron. Astrofis. 9, 134 (2000).