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Volumn 35, Issue 1, 2008, Pages 39-47

MOSFET sensitivity dependence on integrated dose from high-energy photon beams

Author keywords

Dose response; MOSFET; Radiation measurement

Indexed keywords

DOSIMETRY; LOGIC DESIGN; MOSFET DEVICES; PHOTONS;

EID: 37549071493     PISSN: 00942405     EISSN: None     Source Type: Journal    
DOI: 10.1118/1.2815626     Document Type: Article
Times cited : (12)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.