메뉴 건너뛰기




Volumn 49, Issue 13, 2004, Pages

Effects of temperature variation on MOSFET dosimetry

Author keywords

[No Author keywords available]

Indexed keywords

IRRADIATION; MOSFET DEVICES; RADIOTHERAPY; THERMAL EFFECTS; THRESHOLD VOLTAGE; X RAYS;

EID: 3442897997     PISSN: 00319155     EISSN: None     Source Type: Journal    
DOI: 10.1088/0031-9155/49/13/N02     Document Type: Article
Times cited : (43)

References (16)
  • 2
    • 0033727978 scopus 로고    scopus 로고
    • Effects on skin dose from unwanted air gaps under bolus in photon beam radiotherapy
    • Butson M J, Cheung T, Yu K N and Metcalfe P E 2000 Effects on skin dose from unwanted air gaps under bolus in photon beam radiotherapy Radiat. Meas. 32 201-4
    • (2000) Radiat. Meas. , vol.32 , pp. 201-204
    • Butson, M.J.1    Cheung, T.2    Yu, K.N.3    Metcalfe, P.E.4
  • 5
    • 0035990040 scopus 로고    scopus 로고
    • Investigation of the use of MOSFET for clinical IMRT dosimetric verification
    • Chuang C F, Verhey L J and Xia P 2002 Investigation of the use of MOSFET for clinical IMRT dosimetric verification Med. Phys. 29 1109-15
    • (2002) Med. Phys. , vol.29 , pp. 1109-1115
    • Chuang, C.F.1    Verhey, L.J.2    Xia, P.3
  • 7
    • 0036388019 scopus 로고    scopus 로고
    • Measurements in radiotherapy beams using on-line MOSFET detectors
    • Kron T, Rosenfeld A, Lerch M and Bazley S 2002 Measurements in radiotherapy beams using on-line MOSFET detectors Radiat. Prot. Dosim. 101 445-8
    • (2002) Radiat. Prot. Dosim. , vol.101 , pp. 445-448
    • Kron, T.1    Rosenfeld, A.2    Lerch, M.3    Bazley, S.4
  • 12
    • 0036390047 scopus 로고    scopus 로고
    • MOSFET closimetry on modem radiation oncology modalities
    • Rosenfeld A B 2002 MOSFET closimetry on modem radiation oncology modalities Radiat. Prot. Dosim. 101 393-8
    • (2002) Radiat. Prot. Dosim. , vol.101 , pp. 393-398
    • Rosenfeld, A.B.1
  • 14
    • 0029359327 scopus 로고
    • The contribution of border traps to the threshold voltage shift in pMOS closimetric transistors
    • Savic Z, Rajdenovic B, Pejovic M and Stojadinivic N 1995 The contribution of border traps to the threshold voltage shift in pMOS closimetric transistors IEEE Trans. Nucl. Sci. 42 1445-53
    • (1995) IEEE Trans. Nucl. Sci. , vol.42 , pp. 1445-1453
    • Savic, Z.1    Rajdenovic, B.2    Pejovic, M.3    Stojadinivic, N.4
  • 15
    • 0028213977 scopus 로고
    • Evaluation of a dual bias dual metal oxide-silicon semiconductor field effect transistor detector as radiation dosimeter
    • Soubra M, Cygler J and Mackay G 1994 Evaluation of a dual bias dual metal oxide-silicon semiconductor field effect transistor detector as radiation dosimeter Med. Phys. 21567-72
    • (1994) Med. Phys. , vol.21 , pp. 567-572
    • Soubra, M.1    Cygler, J.2    Mackay, G.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.