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Volumn 202, Issue 8, 2008, Pages 1564-1567
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Determining substrate temperature in an AC inverted cylindrical magnetron sputtering PVD system
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Author keywords
Alumina films; Magnetron sputtering; Substrate temperature measurement
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Indexed keywords
ALUMINA;
MAGNETRON SPUTTERING;
SUBSTRATES;
TEMPERATURE MEASUREMENT;
DUAL TARGET INVERTED CYLINDRICAL MAGNETRON SPUTTERING;
ISOFLUX SYSTEM;
PHYSICAL VAPOR DEPOSITION;
ALUMINA;
MAGNETRON SPUTTERING;
PHYSICAL VAPOR DEPOSITION;
SUBSTRATES;
TEMPERATURE MEASUREMENT;
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EID: 37049017637
PISSN: 02578972
EISSN: None
Source Type: Journal
DOI: 10.1016/j.surfcoat.2007.07.007 Document Type: Article |
Times cited : (12)
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References (20)
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