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Volumn 17, Issue 12, 2007, Pages 2505-2515
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Thin silicon wafer dicing with a dual-focused laser beam
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Author keywords
[No Author keywords available]
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Indexed keywords
LASER BEAMS;
PARAMETER ESTIMATION;
THIN FILMS;
LASER PARAMETERS;
LASER WAFER DICING;
SILICON WAFERS;
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EID: 36949017958
PISSN: 09601317
EISSN: 13616439
Source Type: Journal
DOI: 10.1088/0960-1317/17/12/017 Document Type: Article |
Times cited : (21)
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References (12)
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