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Volumn , Issue , 2005, Pages
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GaAs-wafer dicing using the water jet guided laser
a
Synova SA
(Switzerland)
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Author keywords
Compound semiconductors; Edge grinding; GaAs; Laser cutting; Thin wafer dicing; Water jet guided laser
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Indexed keywords
COMPOUND SEMICONDUCTORS;
EDGE GRINDING;
GAAS;
LASER CUTTING;
THIN WAFER DICING;
WATER JET GUIDED LASERS;
CRACKS;
CUTTING EQUIPMENT;
FAILURE (MECHANICAL);
GALLIUM ARSENIDE;
GRINDING (MACHINING);
JETS;
SEMICONDUCTING GALLIUM;
SEMICONDUCTOR DEVICE MANUFACTURE;
SEMICONDUCTOR LASERS;
TECHNOLOGY;
TOXIC MATERIALS;
SILICON WAFERS;
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EID: 84887393718
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (8)
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References (2)
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