Structural properties of Pb 1-xEu xSe/ CaF 2/Si (1 1 1)

Semiconductor Science and Technology

Volumn 22, Issue 12, 2007, Pages 1317-1322

  Zimin, S P ^a   Bogoyavlenskaya, E A ^a   Gorlachev, E S ^a   Naumov, V V ^b   Zimin, D S ^c,d   Zogg, H ^c   Arnold, M ^c  

^a YAROSLAVL STATE UNIVERSITY   (Russian Federation)

^b Institute of Physics and Technology   (Russian Federation)

^c ETH ZURICH   (Switzerland)

^d Balzers AG   (Liechtenstein)

Author keywords

[No Author keywords available]

Indexed keywords

MICROSTRAIN VALUES; THIN BUFFER LAYERS; TRIANGULAR TERRACES;

ATOMIC FORCE MICROSCOPY; FILM GROWTH; MOLECULAR BEAM EPITAXY; PLASMA APPLICATIONS; SCANNING ELECTRON MICROSCOPY; THICK FILMS;

SEMICONDUCTING LEAD COMPOUNDS;

EID: 36448946871     PISSN: 02681242     EISSN: 13616641     Source Type: Journal    
DOI: 10.1088/0268-1242/22/12/014     Document Type: Article

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