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Volumn 40, Issue 4, 1999, Pages 337-342
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Growth and properties of PbTe films on porous silicon
c
480121
(Kazakhstan)
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Author keywords
[No Author keywords available]
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Indexed keywords
AUGER ELECTRON SPECTROSCOPY;
ELECTRON MICROSCOPY;
ETCHING;
FILM GROWTH;
GRAIN SIZE AND SHAPE;
INCLUSIONS;
MULTILAYERS;
OPTICAL MICROSCOPY;
POROUS SILICON;
SEMICONDUCTING LEAD COMPOUNDS;
SUBSTRATES;
X RAY DIFFRACTION ANALYSIS;
ACOUSTIC MICROSCOPY;
CHALCOGEN MICROINCLUSIONS;
LEAD TELLURIDE;
THIN FILMS;
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EID: 0033169424
PISSN: 13504495
EISSN: None
Source Type: Journal
DOI: 10.1016/S1350-4495(99)00018-3 Document Type: Article |
Times cited : (15)
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References (18)
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