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Volumn 40, Issue 4, 1999, Pages 337-342

Growth and properties of PbTe films on porous silicon

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; ELECTRON MICROSCOPY; ETCHING; FILM GROWTH; GRAIN SIZE AND SHAPE; INCLUSIONS; MULTILAYERS; OPTICAL MICROSCOPY; POROUS SILICON; SEMICONDUCTING LEAD COMPOUNDS; SUBSTRATES; X RAY DIFFRACTION ANALYSIS;

EID: 0033169424     PISSN: 13504495     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1350-4495(99)00018-3     Document Type: Article
Times cited : (15)

References (18)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.