Characterization of PbTe epitaxial layers grown on BaF2/CaF2/Si structures

Brazilian Journal of Physics

Volumn 26, Issue 1, 1996, Pages 406-409

  Boschetti, C ^a   Abramof, E ^a   Rappl, P H O ^a   Bandeira, I N ^a   Motisuke, P ^b   Hayashi, M A ^b   Cardoso, L P ^b  

^a INSTITUTO NACIONAL DE PESQUISAS ESPACIAIS   (Brazil)

^b UNIVERSITY OF CAMPINAS   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0030560335     PISSN: 01039733     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (7)

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