Composition dependent structural properties of Pb1-xEuxSe thin films

Thin Solid Films

Volumn 355, Issue , 1999, Pages 12-16

  Sharma, P C ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION EFFECTS; DEPOSITION; DIFFRACTION; EVAPORATION; FILM GROWTH; GRAIN SIZE AND SHAPE; LEAD COMPOUNDS; LIGHT REFLECTION; POLYCRYSTALLINE MATERIALS; THIN FILMS;

CO-EVAPORATION;

OPTICAL FILMS;

EID: 0033341353     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(99)00437-X     Document Type: Article

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7. ASTM Powder Diffraction Files, Joint Committee on Powder Diffraction Standards, Swathmore USA. Cards: 6-0354 (PbSe) (1967); 10-279 (EuSe) (1967) [6-10 Set].
8. Klug H.D., Alexander L.E. X-ray Diffraction Procedures. 1959;503 Wiley, New York.
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