Composition-dependent electrical properties of (Pb, La)(Zr, Sn, Ti)O 3 antiferroelectric thin films grown on platinum-buffered silicon substrates

Journal of Physics D: Applied Physics

Volumn 40, Issue 23, 2007, Pages 7447-7453

  Hao, Xihong ^a   Zhai, Jiwei ^a  

^a TONGJI UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ANTIFERROELECTRIC MATERIALS; ELECTRIC PROPERTIES; FILM GROWTH; PHASE STRUCTURE; PLATINUM; SILICON WAFERS; SOL-GEL PROCESS; SURFACE MORPHOLOGY;

PHASE SWITCHING; PHASE SWITCHING CURRENT; POLARIZATION VERSUS FIELD;

THIN FILMS;

EID: 36348947404     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/40/23/028     Document Type: Article

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