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Volumn 97, Issue 2, 2005, Pages

(Pb,La) (Zr,Sn,Ti) O3 antiferroelectric thin films grown on LaNi O3-buffered and Pt-buffered silicon substrates by sol-gel processing

(3) Li, Xin a Zhai, Jiwei a Chen, Haydn a

a CITY UNIVERSITY OF HONG KONG (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLIZATION; EPITAXIAL GROWTH; GRAIN GROWTH; IONIZATION; LANTHANUM COMPOUNDS; LEAD COMPOUNDS; MICROSTRUCTURE; NUCLEATION; PERMITTIVITY; PLATINUM; POLARIZATION; PYROLYSIS; SILICON; SOL-GELS; THIN FILMS; X RAY DIFFRACTION;

ANTIFERROELECTRIC THIN FILMS; DEIONIZATION; LATTICE MISMATCH; SATURATION POLARIZATION;

ANTIFERROELECTRIC MATERIALS;

EID: 19944431236 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.1834730 Document Type: Article

Times cited : (29)

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