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Volumn 42, Issue 3, 2007, Pages 369-373

Phase transformation behavior of (Pb,La)(Zr,Sn,Ti)O3 and Pb (Nb,Zr,Sn,Ti)O3 antiferroelectric thin films deposited on LaNiO 3-buffered silicon substrates by sol-gel processing

Author keywords

Antiferroelectric; Electrical property; Phase transformation; Sol gel process; Thin film

Indexed keywords

ANTIFERROELECTRIC MATERIALS; DEPOSITION; ELECTRIC FIELD EFFECTS; LEAD COMPOUNDS; PHASE TRANSITIONS; THERMAL EFFECTS;

EID: 34247403399     PISSN: 09280707     EISSN: None     Source Type: Journal    
DOI: 10.1007/s10971-007-0767-z     Document Type: Article
Times cited : (11)

References (17)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.