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Volumn 42, Issue 3, 2007, Pages 369-373
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Phase transformation behavior of (Pb,La)(Zr,Sn,Ti)O3 and Pb (Nb,Zr,Sn,Ti)O3 antiferroelectric thin films deposited on LaNiO 3-buffered silicon substrates by sol-gel processing
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Author keywords
Antiferroelectric; Electrical property; Phase transformation; Sol gel process; Thin film
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Indexed keywords
ANTIFERROELECTRIC MATERIALS;
DEPOSITION;
ELECTRIC FIELD EFFECTS;
LEAD COMPOUNDS;
PHASE TRANSITIONS;
THERMAL EFFECTS;
ANTIFERROELECTRIC THIN FILMS;
SILICON SUBSTRATES;
THERMAL ACTIVATION;
THIN FILMS;
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EID: 34247403399
PISSN: 09280707
EISSN: None
Source Type: Journal
DOI: 10.1007/s10971-007-0767-z Document Type: Article |
Times cited : (11)
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References (17)
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