Diffusion-based placement migration with application on legalization

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 26, Issue 12, 2007, Pages 2158-2172

  Ren, Haoxing ^a,b   Pan, David Z ^a,c   Alpert, Charles J ^a,d   Villarrubia, Paul G ^e   Nam, Gi Joon ^a,d  

^a IEEE

^b IBM T J WATSON RESEARCH CENTER   (United States)

^c UNIVERSITY OF TEXAS AT AUSTIN   (United States)

^d IBM AUSTIN RESEARCH LABORATORY   (United States)

^e IBM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HEAT DISTRIBUTION; PLACEMENT MIGRATION; ROUTING CONGESTION; SIGNAL INTEGRITY;

DIFFUSION; PERTURBATION TECHNIQUES; PROBLEM SOLVING; THERMAL VARIABLES MEASUREMENT;

ROUTING ALGORITHMS;

EID: 36348946448     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCAD.2007.907005     Document Type: Article

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