Automated nanomanipulation with atomic force microscopes

Proceedings - IEEE International Conference on Robotics and Automation

Volumn , Issue , 2007, Pages 1406-1412

  Mokaberi, Babak ^a,b   Yun, Jaehong ^b   Wang, Michael ^b   Requicha, Aristides A G ^a,b  

^a IEEE   (United States)

^b UNIVERSITY OF SOUTHERN CALIFORNIA   (United States)

Author keywords

AFMs; Atomic force microscopes; Automatic nanomanipulation; Creep; Drift; Hysteresis; Nanorobotics

Indexed keywords

AUTOMATIC NANOMANIPULATION; DRIFT; POSITIONING MECHANISMS; SPATIAL UNCERTAINTIES;

ATOMIC FORCE MICROSCOPY; HYSTERESIS; NANOROBOTICS; PARTICLE SIZE; UNCERTAINTY ANALYSIS; USER INTERFACES;

MANIPULATORS;

EID: 36348941791     PISSN: 10504729     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ROBOT.2007.363181     Document Type: Conference Paper

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