-
1
-
-
36049039810
-
-
ISO Standard No. 11254-1:2000; ISO Standard No. 11254-2:2001.
-
ISO Standard No. 11254-1:2000; ISO Standard No. 11254-2:2001.
-
-
-
-
2
-
-
0032635463
-
-
J. Hue, J. Dijon, G. Ravel, P. Lyan, P. Garrec, T. Lanternier, M. Olivier, and A. Lagrange, Proc. SPIE 3578, 290 (1999);
-
(1999)
Proc. SPIE
, vol.3578
, pp. 290
-
-
Hue, J.1
Dijon, J.2
Ravel, G.3
Lyan, P.4
Garrec, P.5
Lanternier, T.6
Olivier, M.7
Lagrange, A.8
-
3
-
-
0032640426
-
-
L. Sheehan, S. Schwartz, C. Battersby, R. Dickson, R. Jennings, J. Kimmons, M. Kozlowski, S. Maricle, R. Mouser, M. Runkel, and C. Weinzapfel, ibid. 3578, 302 (1998).
-
(1998)
Proc. SPIE
, vol.3578
, pp. 302
-
-
Sheehan, L.1
Schwartz, S.2
Battersby, C.3
Dickson, R.4
Jennings, R.5
Kimmons, J.6
Kozlowski, M.7
Maricle, S.8
Mouser, R.9
Runkel, M.10
Weinzapfel, C.11
-
4
-
-
5544304915
-
-
H. Bercegol, P. Bouchut, L. Lamaignère, B. Le Garree, and G. Razé, Proc. SPIE 5273, 312 (2004).
-
(2004)
Proc. SPIE
, vol.5273
, pp. 312
-
-
Bercegol, H.1
Bouchut, P.2
Lamaignère, L.3
Le Garree, B.4
Razé, G.5
-
5
-
-
0041861100
-
-
G. Razé, J.-M. Morchain, M. Loiseau, L. Lamaignère, M. Josse, and H. Bercegol, Proc. SPIE 4932, 127 (2003).
-
(2003)
Proc. SPIE
, vol.4932
, pp. 127
-
-
Razé, G.1
Morchain, J.-M.2
Loiseau, M.3
Lamaignère, L.4
Josse, M.5
Bercegol, H.6
-
6
-
-
33644594754
-
-
M. A. Norton, E. E. Donohue, M. D. Feit, R. P. Hackel, W. G. Hollingswoith, A. M. Rubenchik, and M. L. Spaeth, Roc. SPIE 5991, 599108-1 (2006).
-
M. A. Norton, E. E. Donohue, M. D. Feit, R. P. Hackel, W. G. Hollingswoith, A. M. Rubenchik, and M. L. Spaeth, Roc. SPIE 5991, 599108-1 (2006).
-
-
-
-
7
-
-
0032690613
-
-
S. Schwartz, M. D. Feit, M. R. Kozlowski, and R. P. Mouser, Proc. SPIE 3578, 314 (1999).
-
(1999)
Proc. SPIE
, vol.3578
, pp. 314
-
-
Schwartz, S.1
Feit, M.D.2
Kozlowski, M.R.3
Mouser, R.P.4
-
8
-
-
0032635462
-
-
M. D. Feit, A. M. Rubenchik, M. R. Kozlowski, F. Y. Génin, S. Schwartz, and L. M. Sheehan, Proc. SPIE 3578, 226 (1999).
-
(1999)
Proc. SPIE
, vol.3578
, pp. 226
-
-
Feit, M.D.1
Rubenchik, A.M.2
Kozlowski, M.R.3
Génin, F.Y.4
Schwartz, S.5
Sheehan, L.M.6
-
9
-
-
9144248712
-
-
T. Kamimura, S. Akamatsu, H. Horibe, H. Shiba, S. Motokoshi, T. Sakamoto, T. Jitsuno, T. Okamato, and K. Yoshida, Jpn. J. Appl. Phys., Part 2 43, L1229 (2004).
-
(2004)
Jpn. J. Appl. Phys., Part 2
, vol.43
-
-
Kamimura, T.1
Akamatsu, S.2
Horibe, H.3
Shiba, H.4
Motokoshi, S.5
Sakamoto, T.6
Jitsuno, T.7
Okamato, T.8
Yoshida, K.9
-
10
-
-
28944453518
-
-
J. Néauport, L. Lamaignère, H. Bercegol, F. Pilon, and J.-C. Birolleau, Opt. Express 13, 10163 (2005).
-
(2005)
Opt. Express
, vol.13
, pp. 10163
-
-
Néauport, J.1
Lamaignère, L.2
Bercegol, H.3
Pilon, F.4
Birolleau, J.-C.5
-
11
-
-
18744399323
-
-
M. Josse, R. Courchinoux, L. Lamaignère, J. C. Poncetta, T. Don val, and H. Bercegol, Proc. SPIE 5647, 365 (2005).
-
(2005)
Proc. SPIE
, vol.5647
, pp. 365
-
-
Josse, M.1
Courchinoux, R.2
Lamaignère, L.3
Poncetta, J.C.4
Don val, T.5
Bercegol, H.6
-
12
-
-
20844454349
-
-
J. J. Adams, T. L. Weiland, J. R. Stanley, W. D. Sell, R. L. Luthi, J. L. Vickers, C. W. Carr, M. D. Feit, A. M. Rubenchik, M. L. Spaeth, and R. P. Hackel, Proc. SPIE 5647, 265 (2005).
-
(2005)
Proc. SPIE
, vol.5647
, pp. 265
-
-
Adams, J.J.1
Weiland, T.L.2
Stanley, J.R.3
Sell, W.D.4
Luthi, R.L.5
Vickers, J.L.6
Carr, C.W.7
Feit, M.D.8
Rubenchik, A.M.9
Spaeth, M.L.10
Hackel, R.P.11
-
13
-
-
9744277558
-
-
P. DeMange, C. W. Carr, H. B. Radousky, and S. G. Demos, Rev. Sci. Instrum. 75, 3298 (2004).
-
(2004)
Rev. Sci. Instrum
, vol.75
, pp. 3298
-
-
DeMange, P.1
Carr, C.W.2
Radousky, H.B.3
Demos, S.G.4
-
14
-
-
36048986954
-
-
American Society for Testing and Materials, Philadelphia
-
J. E. Swain, Damage in Laser Glass (American Society for Testing and Materials, Philadelphia, 1969), pp. 69-78.
-
(1969)
Damage in Laser Glass
, pp. 69-78
-
-
Swain, J.E.1
-
15
-
-
33644587261
-
-
H. Bercegol, L. Lamaignère, V. Cavara, and M. Loiseau, Proc. SPIE 5991, 59911Z-1 (2006), and references therein.
-
H. Bercegol, L. Lamaignère, V. Cavara, and M. Loiseau, Proc. SPIE 5991, 59911Z-1 (2006), and references therein.
-
-
-
-
18
-
-
36749111090
-
-
N. L. Boling, P. Braünlich, A. Schmid, and P. Kelly, Appl. Phys. Lett. 27, 191 (1971).
-
(1971)
Appl. Phys. Lett
, vol.27
, pp. 191
-
-
Boling, N.L.1
Braünlich, P.2
Schmid, A.3
Kelly, P.4
-
19
-
-
0000004889
-
Opt. Eng. (Bellingham.)
-
S. C. Jones, P. Braünlich, R. T. Casper, X.-A. Shen, and P. Kelly, Opt. Eng. (Bellingham.) 28, 1039 (1989).
-
(1989)
, vol.28
, pp. 1039
-
-
Jones, S.C.1
Braünlich, P.2
Casper, R.T.3
Shen, X.-A.4
Kelly, P.5
-
20
-
-
0036602853
-
-
J.-Y. Natoli, L. Gallais, H. Akhouayri, and C. Amra, Appl. Opt. 41, 3156 (2002).
-
(2002)
Appl. Opt
, vol.41
, pp. 3156
-
-
Natoli, J.-Y.1
Gallais, L.2
Akhouayri, H.3
Amra, C.4
-
22
-
-
15844383095
-
-
A. V. Hamza W. J. Siekhaus, A. M. Rubenchik, M. D. Feit, L. L. Chase, M. Savina, M. J. Pellin, I. D. Hutcheon, M. C. Nostrand, M. Runkel, B. W. Choi, M. C. Staggs, and M. J. Fluss, Proc. SPIE 4679, 96 (2002);
-
(2002)
Proc. SPIE
, vol.4679
, pp. 96
-
-
Hamza, A.V.1
Siekhaus, W.J.2
Rubenchik, A.M.3
Feit, M.D.4
Chase, L.L.5
Savina, M.6
Pellin, M.J.7
Hutcheon, I.D.8
Nostrand, M.C.9
Runkel, M.10
Choi, B.W.11
Staggs, M.C.12
Fluss, M.J.13
-
23
-
-
18744384092
-
-
H. Bercegol R. Courchinoux, M. Josse, and J. L. Rullier, ibid. 5647, 78 (2005);
-
(2005)
Proc. SPIE
, vol.5647
, pp. 78
-
-
Bercegol, H.1
Courchinoux, R.2
Josse, M.3
Rullier, J.L.4
-
24
-
-
34247324372
-
-
M. A. Josse, H. Bercegol R. Courchinoux, T. Donval, L. Lamaignère, B. Pussacq, and J. L. Rullier, ibid. 6403, 64030E (2007).
-
(2007)
Proc. SPIE
, vol.6403
-
-
Josse, M.A.1
Bercegol, H.2
Courchinoux, R.3
Donval, T.4
Lamaignère, L.5
Pussacq, B.6
Rullier, J.L.7
-
27
-
-
36049035564
-
Progress in the Understandig of Fracture Related Damage of Fused Silica
-
unpublished
-
P. Grua, J. P. Morreeuw, and H. Bercegol "Progress in the Understandig of Fracture Related Damage of Fused Silica," Proc. SPIE (unpublished).
-
Proc. SPIE
-
-
Grua, P.1
Morreeuw, J.P.2
Bercegol, H.3
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