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Volumn 5991, Issue , 2005, Pages

Impact of contaminates on the laser damage threshold of 1ω HR coatings

Author keywords

1 micron high reflectors; Laser damage; Laser damage growth; Particulate contamination

Indexed keywords

1 MICRON HIGH REFLECTORS; FLUENCE RANGE; LASER DAMAGE GROWTH; PARTICULATE CONTAMINATION;

EID: 33644594754     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.638832     Document Type: Conference Paper
Times cited : (31)

References (3)
  • 1
    • 18744376326 scopus 로고    scopus 로고
    • In-situ surface debris inspection and removal system for upward-facing transport mirrors of the National Ignition Facility
    • W. H. Gourdin, E. Dzenitis, D. Martin, K. Listiyo, G. Sherman, W. Kent, R. Butlin, C. J. Stolz and J. Pryatel, "In-situ surface debris inspection and removal system for upward-facing transport mirrors of the National Ignition Facility", Proc. SPIE 5647, 107, 2004.
    • (2004) Proc. SPIE , vol.5647 , pp. 107
    • Gourdin, W.H.1    Dzenitis, E.2    Martin, D.3    Listiyo, K.4    Sherman, G.5    Kent, W.6    Butlin, R.7    Stolz, C.J.8    Pryatel, J.9
  • 2
    • 0034857223 scopus 로고    scopus 로고
    • Laser conditioning characterization and damage threshold prediction of hafnia/silica multilayer mirrors by photothermal microscopy
    • A. B. Papandrew, C. J. Stolz, Z. L. Wu, G. E. Loomis, and S. Flabella, "Laser conditioning characterization and damage threshold prediction of hafnia/silica multilayer mirrors by photothermal microscopy", Proc. SPIE 4347, 53, 2000.
    • (2000) Proc. SPIE , vol.4347 , pp. 53
    • Papandrew, A.B.1    Stolz, C.J.2    Wu, Z.L.3    Loomis, G.E.4    Flabella, S.5
  • 3
    • 0029185057 scopus 로고
    • Design and operation of a 150 W near diffraction-limited laser amplifier with SBS wavefront correction
    • C. B. Dane, L. E. Zapata. W. A. Neuman, M. A. Norton, and L. A. Hackel, "Design and Operation of a 150 W Near Diffraction-limited Laser Amplifier with SBS Wavefront Correction," IEEE J. Quantum Electronics, 31, pp. 148-163, 1995.
    • (1995) IEEE J. Quantum Electronics , vol.31 , pp. 148-163
    • Dane, C.B.1    Zapata, L.E.2    Neuman, W.A.3    Norton, M.A.4    Hackel, L.A.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.