Engineered defects for investigation of laser-induced damage of fused silica at 355 nm

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4679, Issue , 2002, Pages 96-107

  Hamza, A V ^a   Siekhaus, W J ^a   Rubenchik, A M ^a   Feit, M ^a   Chase, L L ^a   Savina, M ^b   Pellin, M J ^b   Hutcheon, I D ^a   Nostrand, M C ^a   Runkel, M ^a   Choi, B W ^a   Staggs, M ^a   Fluss, M J ^a  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^b ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

Controlled indentations; Controlled scratches; Laser induced damage at 355 nm; Nanoparticles

Indexed keywords

ATOMIC FORCE MICROSCOPY; FUSED SILICA; LIGHT SCATTERING; NANOSTRUCTURED MATERIALS; PLASTIC DEFORMATION;

CONTROLLED INDENTATIONS;

LASER DAMAGE;

EID: 15844383095     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.461716     Document Type: Article

References (10)

1. F.Y. Genin, A. Salleo, T.V. Pistor, and L.L. Chase, Journal of The Optical Society of America A-Optics Image Science And Vision 18, 2607 (2001).
2. A. Salleo, F.Y. Genin, J. Yoshiyama, C.J. Stolz, and M.R. Koslowski, "Laser-induced damage of fused silica at 355 nm initiated at scratches," in Laser-Induced Damage in Optical Materials: 1997, G.J. Exarhos, A.H. Guenther, M.R. Kozlowski, M.J. Soileau, Editors, SPIE Vol. 3244, 341 (1998).
3. D.W. Camp, M.R. Kozlowski, L.M. Sheehan, M. Nichols, M. Dovik, R. Raether, and I. Thomas, "Subsurface damage and polishing compound affect the 355-nm laser damage threshold of fused silica surfaces," in Laser-Induced Damage in Optical Materials: 1997, G.J. Exarhos, A.H. Guenther, M.R. Kozlowski, M.J. Soileau, Editors, SPIE Vol. 3244, 356 (1998).
4. M.D. Feit, J. Campbell, D. Faux, F.Y. Genin, M.R. Kozlowski, A.M. Rubenchik, R. Riddle, A. Salleo, and J. Yoshiyama, "Modeling of laser-induced surface cracks in silica at 355 nm," in Laser-Induced Damage in Optical Materials: 1997, G.J. Exarhos, A.H. Guenther, M.R. Kozlowski, M.J. Soileau, Editors, SPIE Vol. 3244, 350 (1998).
5. S. Papernov, A.W. Schmid, R. Krishnan, and L. Tsybeskov, "Using colloidal gold nanoparticles for studies of laser interaction with defects in thin films," in Laser-Induced Damage in Optical Materials: 2000, G.J. Exarhos, A.H. Guenther, M.R. Kozlowski, K.L. Lewis, M.J. Soileau, Editors, SPIE Vol. 4347, 146 (2001).
6. M.J. Pellin, C.E. Young, W.F. Calaway, J.E. Whitten, D.M. Gruen, J.D. Blum, I.D. Hutcheon, G.J. Wasserburg, Philosophical Transactions Of The Royal Society Of London Series A-Mathematical Physical And Engineering Sciences 333, 133 (1990).
7. C.Z. Tan, J. Amdt, and H.S. Xie, Physica B 252, 28 (1998).
8. J. Wong, D. Haupt, J. Kinney, J. Ferriere, I. Hutcheon, S. Demos, and M. Kozlowski, "Nature of damage in fused silica induced by high-fluence 3-omega 355-nm laser pulses, a multiscale morphology microstructure and defect chemistry study,. in Laser-Induced Damage in Optical Materials: 2000, G.J. Exarhos, A.H. Guenther, M.R. Kozlowski, K.L. Lewis, M.J. Soileau, Editors, SPIE Vol. 4347, 466. (2001).
9. A. Kubota, M.J. Caturla, J.S. Stolken, and M.D. Feit, "Densification of fused silica due to shock waves and its implications for 351 nm laser induced damage," Optics Express 8, 611 (2001).
10. N. Blombergen, "Laser induced electric breakdown in solids," IEEE J. of Quantum Electr. 10, 375 (1974).