Microstructure evolution and dielectric properties of Ba0.7Sr0.3TiO3 parallel plate capacitor with Cr interlayer

Surface and Coatings Technology

Volumn 202, Issue 4-7, 2007, Pages 768-773

  Ho, Chia Cheng ^a   Chiou, Bi Shiou ^a   Chang, Li Chun ^b  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

^b HUAFAN UNIVERSITY   (Taiwan)

Author keywords

BST; Capacitor; Dielectric material; Interlayer; Microstructure

Indexed keywords

ANNEALING; DIELECTRIC MATERIALS; DIELECTRIC PROPERTIES; SANDWICH STRUCTURES; SURFACE MORPHOLOGY;

CRYSTALLINE CUBIC PHASE; PARALLEL PLATE CAPACITOR;

BARIUM COMPOUNDS;

ANNEALING; BARIUM COMPOUNDS; DIELECTRIC MATERIALS; DIELECTRIC PROPERTIES; SANDWICH STRUCTURES; SURFACE MORPHOLOGY;

EID: 36049009432     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.surfcoat.2007.05.077     Document Type: Article

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