Thickness effects on the electrical characteristics of Ba 0.7Sr0.3TiO3 capacitors with nano-Cr interlayer

Applied Physics Letters

Volumn 90, Issue 13, 2007, Pages

  Ho, Chia Cheng ^c   Chiou, Bi Shiou ^a   Chang, Li Chun ^b  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

^b HUAFAN UNIVERSITY   (Taiwan)

^c NONE

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; CAPACITANCE; DIELECTRIC PROPERTIES; ELECTRIC PROPERTIES; PERMITTIVITY; SUBSTRATES; X RAY DIFFRACTION ANALYSIS;

MONOLAYER DIELECTRICS; NANO-CR INTERLAYERS; TEMPERATURE COEFFICIENT;

CERAMIC CAPACITORS;

EID: 34047185302     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2717553     Document Type: Article

References (12)

1. D. C. Shye, B. S. Chiou, M. J. Lai, C. C. Hwang, C. C. Jaing, J. S. Chen, M. H. Cheng, and H. C. Cheng, J. Electrochem. Soc. 150, F20 (2003).
2. D. C. Shye, B. S. Chiou, M. W. Kuo, J. S. Chen, B. C. S. Chou, C. C. Jaing, M. F. Wu, and H. C. Cheng, Electrochem. Solid-State Lett. 6, G55 (2003).
3. J. W. Liou and B. S. Chiou, J. Mater. Sci.: Mater. Electron. 11, 637 (2000).
4. C. C. Ho, B. S. Chiou, L. C. Chang, C. C. Chou, B. H. Liou, and C. C. Yu, Surf. Coat. Technol. 201, 4163 (2006).
5. M. W. Kuo, D. C. Shye, B. S. Chiou, J. S. Chen, and H. C. Cheng, Integr. Ferroelectr. 61, 183 (2004).
6. W. C. Yi, T. S. Kalkur, E. Philofsky, and L. Kammerdiner, Thin Solid Films 402, 307 (2002).
7. S. Y. Chen, H. W. Wang, and L. C. Huang, Jpn. J. Appl. Phys., Part 1 40, 4974 (2001).
8. K. T. Kim and C. I. Kim, Thin Solid Films 472, 26 (2005).
9. K. H. Yoon, J. C. Lee, J. Park, D. H. Kang, C. M. Song, and Y. G. Seo, Jpn. J. Appl. Phys., Part 1 40, 5497 (2001).
10. Y. Xia, D. Wu, and Z. Liu, J. Phys. D 37, 2256 (2004).
11. J. J. Si, H. Ono, K. Uchida, H. Morisaki, and N. Itoh, Appl. Phys. Lett. 79, 3140 (2001).
12. A. G. Cockbain and P. J. Harrop, J. Appl. Phys. 1, 1109 (1968).