Determination of the thickness and optical constants of transparent indium-doped ZnO thin films by the envelope method

Materials Science- Poland

Volumn 25, Issue 3, 2007, Pages 709-718

  Ilican, S ^a   Caglar, M ^a   Caglar, Y ^a  

^a ANADOLU UNIVERSITY   (Turkey)

Author keywords

Envelope method; Spray pyrolysis; ZnO

Indexed keywords

CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; FILM THICKNESS; GRAIN SIZE AND SHAPE; OPTICAL CONSTANTS; PYROLYSIS; REFRACTIVE INDEX; X RAY DIFFRACTION; ZINC OXIDE;

CRYSTALLOGRAPHIC STRUCTURE; ENVELOPE METHOD; EXTINCTION COEFFICIENT; SPRAY PYROLYSIS; TRANSMITTANCE;

THIN FILMS;

EID: 36048993962     PISSN: 01371339     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (26)

1. SUCHEA M., CHRISTOULAKIS S., MOSCHOVIS K., KATSARAKIS N., KIRIAKIDIS G., Thin Solid Films, 515 (2006), 551.
2. WATER W., CHU S.-Y., JUANG Y.-D, WU S.-J., Mater. Lett., 57 (2002), 998.
3. MICHELOTTI F., BELARDINI A., ROUSSEAU A., RATSIMIHETY A., SCHOER G., MUELLER J., J. Non-Cryst. Solids, 352 (2006), 2339.
4. HUPKES J., RECH B., KLUTH O., REPMANN T., ZWAYGARDT B., MULLER J., DRESE R., WUTTIG M., Sol. Energ. Mat. Sol. Cells, 90 (2006), 3054.
5. JEONG WJ, KIM S.K, PARK G.C., Thin Solid Films, 506-507 (2006), 180.
6. XINGWEN Z., YONGQIANG L., YE L., YINGWEI L., YIBEN X., Vacuum, 81 (2006), 502.
7. YE J.D., GU S.L., ZHU S.M., LIU S.M., ZHENG Y.D., ZHANG R., SHI Y., YU H.Q., YE Y.D., J. Cryst. Growth, 283 (2005), 279.
8. GHOSH R., PAUL G.K., BASAK D., Mater. Res. Bull., 40 (2005), 1905.
9. AYOUCHI R., LEINEN D., MARTIN F., GABAS M., DALCHIELE E., RAMOS-BARRADO J. R., Thin Solid Films, 426 (2003) 68.
10. MARTINS R., IGREJA R., FERREIRA I., MARQUES A., PIMENTEL A., GONÇALVES A., FORTUNATO E., Mat. Sci. Eng. B, 118 (2005), 135.
11. SWANEPOELR, J. Phys. E: Sci. Instrum., 16 (1983), 1214.
12. HOU Y.-Q., ZHUANG D.-M., ZHANG G., ZHAO M., WU M.-S, Appl. Surf. Sci., 218 (2003), 97.
13. METIN H., ESEN R., J. Cryst. Growth, 258 (2003) 141.
14. CAGLAR M., CAGLAR Y., ILICAN S., J. Optoelectron. Adv. Mater., 8 (2006), 1410.
15. SENADIM E., KAVAK H., ESEN R., J. Phys. Condens. Mat., 18 (2006), 6391.
16. GUMUS C., OZKENDIR O.M., KAVAK H., UFUKTEPE Y., J. Optoelectron. Adv. Mater., 8 (2006), 299.
17. MULLEROVA J., MUDRON J., Acta Phys. Slovaca, 50 (2000), 477.
18. SENADIM E. EKER S., KAVAK H. ESEN R., Solid State Commun., 139 (2006), 479.
19. CAGLAR Y., ILICAN S., CAGLAR M., YAKUPHANOGLU F., Spectrochim. Acta A, 67 (2007), 1113.
20. Joint Committee on Powder Diffraction Standards, Powder Diffraction File, card no: 36-1451.
21. CULLITY B.D., STOCK S.R., Elements of X-Ray Diffraction, 3nd Ed, Prentice Hall, New York, 2001.
22. BARRETCS, MASSALSKI T.B., Structure of Metals, Pergamon Press, Oxford, 1980.
23. BHIRA L., ESSAIDI H., BELGACEM S., COUTURIER G., SALARDENNE J., BARREAUX N., BERNEDE J.C., phys. status solidi (a), 181 (2000), 427.
24. GEORGE J., JOSEPH K.S., PRADEEP B., PALSON T.I , phys. status solidi (a), 106(1988), 123.
25. MANIFACIER J.C., GASIOT J., PILLARD J.P., J. Phys. E, 9 (1976), 1002.
26. MOTT N.F, GURNEY R.W, Electronic Processes in Ionic Crystals, Oxford Univ. Press, London, 1940.