Inherent Time Redundancy (ITR): Using program repetition for low-overhead fault tolerance

Proceedings of the International Conference on Dependable Systems and Networks

Volumn , Issue , 2007, Pages 307-316

  Reddy, Vimal ^a   Rotenberg, Eric ^a  

^a NORTH CAROLINA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INHERENT TIME REDUNDANCY (ITR); MICROARCHITECTURAL EVENTS; TRANSIENT FAULTS;

DATA ACQUISITION; DATA STORAGE EQUIPMENT; PROGRAM PROCESSORS;

FAULT TOLERANCE;

EID: 36048959599     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DSN.2007.59     Document Type: Conference Paper

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