Surface elastic properties of porous nanosilica coatings by scanning force microscopy

Applied Physics Letters

Volumn 91, Issue 16, 2007, Pages

  Vincent, A ^a   Babu, S ^a   Seal, S ^a  

^a University of Central Florida   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELASTIC MODULI; OPTICAL COATINGS; PARTICLE SIZE; SILICA; SILICONE COATINGS; SOL-GEL PROCESS;

CATALYST CONCENTRATION; FORCE-DISTANCE SPECTROSCOPY; POROUS NANOSILICA; SURFACE ELASTIC PROPERTIES;

NANOCRYSTALLINE SILICON;

EID: 35548957316     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2799249     Document Type: Article

References (26)

1. B. B. Avar, N. Hudyma, and M. Karakouzian, Int. J. Rock Mech. Min. Sci. 40, 919 (2003).
2. H. Fan, C. Hartshorn, T. Buchheit, D. Tallant, R. Assink, R. Simpson, D. J. Kissel, D. J. Lacks, S. Torquato, and C. J. Brinker, Nat. Mater. 6, 418 (2007).
3. A. Vincent, S. Babu, E. Brinley, A. Karakoti, S. Deshpande, and S. Seal, J. Phys. Chem. C. 111, 8291 (2007).
4. Y. Chen, K. Balani, and A. Agarwal, Appl. Phys. Lett. 91, 031903 (2007).
5. G. M. Pharr and W. C. Oliver, MRS Bull. 17, 28 (1992).
6. A. B. Nancy and J. C. Richard, J. Vac. Sci. Technol. A 7, 2906 (1989).
7. K. Miyake, N. Satomi, and S. Sasaki, Appl. Phys. Lett. 89, 031925 (2006).
8. M. B. Salmeron, MRS Bull. 18, 20 (1993).
9. A. J. Heim, W. G. Matthews, and T. J. Koob, Appl. Phys. Lett. 89, 181902 (2006).
10. E. P. S. Tan and C. T. Lim, Appl. Phys. Lett. 87, 123106 (2005).
11. C. Munuera, T. R. Matzelle, N. Kruse, M. F. Lopez, A. Gutierrez, J. A. Jimenez, and C. Ocal, Acta Biomat. 3, 113 (2007).
12. M. Salerno and I. Bykov, Microscopy and Analysis 20, S5 (2006).
13. S. Garcia-Manyes, A. G. Güell, P. Gorostiza, and F. Sanz, J. Chem. Phys. 123, 114711 (2005).
14. A. Touhami, B. Nysten, and Y. F. Dufrene, Langmuir 19, 4539 (2003).
15. J. E. Sader, J. W. M. Chon, and P. Mulvaney, Rev. Sci. Instrum. 70, 3967 (1999).
16. W. A. Brantley, J. Appl. Phys. 44, 534 (1973).
17. J. Gross, G. Reichenauer, and J. Fricke, J. Phys. D 21, 1447 (1988).
18. M. Perkins, S. J. Ebbens, S. Hayes, C. J. Roberts, C. E. Madden, S. Y. Luk, and N. Patel, Int. J. Pharm. 332, 168 (2007).
19. R. Gissi and P. Decuzzi, J. Appl. Phys. 98, 014310 (2005).
20. C. M. Chan, G. Z. Cao, H. Fong, M. Sarikaya, T. Robinson, and L. Nelson, Mater. Res. 15, 148 (2000).
21. S. Yu, T. K. S. Wong, X. Hu, and M. S. Yong, J. Sol-Gel Sci. Technol. 35, 69 (2005).
22. S. Takada, N. Hata, Y. Seino, K. Yamada, Y. Oku, and T. Kikkawa, Jpn. J. Appl. Phys., Part 1 43, 2453 (2004).
23. M. Moner-Girona, A. Roig, E. Molins, E. Martinez, and J. Esteve, Appl. Phys. Lett. 75, 653 (1999).
24. M. Gronauer and J. Fricke, Acustica 59, 177 (1986).
25. K. L. Johnson, Contact Mechanics (Cambridge University Press, Cambridge, 1985), pp. 397-423.
26. J. A. Greenwood and J. H. Tripp, J. Appl. Mech. 34, 153 (1967).