Nanomechanics of silicon surfaces with atomic force microscopy: An insight to the first stages of plastic deformation

Journal of Chemical Physics

Volumn 123, Issue 11, 2005, Pages

  Garcia Manyes, Sergi ^a   Güell, Aleix G ^a   Gorostiza, Pau ^b   Sanz, Fausto ^a  

^a UNIVERSITY OF BARCELONA   (Spain)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; FORCE MEASUREMENT; IMAGING TECHNIQUES; NANOSTRUCTURED MATERIALS;

COVALENT MATERIALS; DIAMOND TIPS; NANOMECHANICS;

SILICON;

EID: 25444519218     PISSN: 00219606     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2035094     Document Type: Article

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