메뉴 건너뛰기




Volumn , Issue , 2007, Pages 373-380

Vibration testing and analysis of ball grid array package solder joints

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; FATIGUE OF MATERIALS; RELIABILITY THEORY; SOLDERED JOINTS; STRAIN; STRESS ANALYSIS; VIBRATION ANALYSIS;

EID: 35348894354     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ECTC.2007.373825     Document Type: Conference Paper
Times cited : (58)

References (20)
  • 1
    • 0025448513 scopus 로고
    • Combined Vibrational and Thermal Solder Joint Fatigue - A Generalized Strain versus Life Approach
    • Barker, D. et al, "Combined Vibrational and Thermal Solder Joint Fatigue - A Generalized Strain versus Life Approach," Journal of Electronic Packaging, Vol. 112 (1990), pp. 129-134.
    • (1990) Journal of Electronic Packaging , vol.112 , pp. 129-134
    • Barker, D.1
  • 2
    • 0026173560 scopus 로고
    • Low Cycle Fatigue of Sn96 Solder with Reference to Eutectic Solder and High Pb Solder
    • Solomon, H. D., "Low Cycle Fatigue of Sn96 Solder with Reference to Eutectic Solder and High Pb Solder," Transactions of ASME, Vol. 113 (1991), pp. 102-108.
    • (1991) Transactions of ASME , vol.113 , pp. 102-108
    • Solomon, H.D.1
  • 3
    • 0027608581 scopus 로고
    • Fatigue Crack Growth Rate in 63Sn37Pb Solder Joints
    • Guo, Z. and Conrad, H., "Fatigue Crack Growth Rate in 63Sn37Pb Solder Joints," Journal of Electronic Packaging, Vol. 115 (1993), pp. 159-164.
    • (1993) Journal of Electronic Packaging , vol.115 , pp. 159-164
    • Guo, Z.1    Conrad, H.2
  • 4
    • 0035455435 scopus 로고    scopus 로고
    • The Characterization of Vibration Fracture of Pb-Sn and Lead Free Sn-Zn Eutectic Solders
    • Chuang, C. M., Lui, T. S. and Chen, L. H., "The Characterization of Vibration Fracture of Pb-Sn and Lead Free Sn-Zn Eutectic Solders," Journal of Electronic Materials, Vol. 30 (2001), pp. 1232-1240.
    • (2001) Journal of Electronic Materials , vol.30 , pp. 1232-1240
    • Chuang, C.M.1    Lui, T.S.2    Chen, L.H.3
  • 5
    • 0033875279 scopus 로고    scopus 로고
    • Low Cycle Fatigue Analysis of Temperature and Frequency Effects in Eutectic Solder Alloy
    • Shi, X. Q. et al, "Low Cycle Fatigue Analysis of Temperature and Frequency Effects in Eutectic Solder Alloy," International Journal of Fatigue, Vol. 22 (2000), pp. 217-228.
    • (2000) International Journal of Fatigue , vol.22 , pp. 217-228
    • Shi, X.Q.1
  • 6
    • 35348892437 scopus 로고    scopus 로고
    • Experimental Study and Life Prediction on High Cycle Vibration Fatigue in BGA Packages
    • Liu, X. et al, "Experimental Study and Life Prediction on High Cycle Vibration Fatigue in BGA Packages," Microelectronics Reliability, Vol. 26 (2006), pp. 11281138.
    • (2006) Microelectronics Reliability , vol.26 , pp. 11281138
    • Liu, X.1
  • 7
    • 0004274342 scopus 로고
    • Cambridge University Press Cambridge
    • Suresh, S., Fatigue of Materials. Cambridge University Press (Cambridge, 1992), pp. 126-140.
    • (1992) Fatigue of Materials , pp. 126-140
    • Suresh, S.1
  • 14
    • 35348904248 scopus 로고    scopus 로고
    • ABAOUS User Manual (version 6.5). ABAQUS Inc., 2005.
    • ABAOUS User Manual (version 6.5). ABAQUS Inc., 2005.
  • 15
    • 35348838792 scopus 로고    scopus 로고
    • Solder Joint Reliability Prediction of Flip Chip Packages Under Shock Loading Environment
    • San Francisco, CA, July
    • Loh, W. K. and Garner, L. J., "Solder Joint Reliability Prediction of Flip Chip Packages Under Shock Loading Environment," InterPACK, San Francisco, CA, July. 2005.
    • (2005) InterPACK
    • Loh, W.K.1    Garner, L.J.2
  • 17
    • 35348921539 scopus 로고    scopus 로고
    • Annual Book of ASTM Standards. 03.01, ASTM E 1049-85 (Reapproved 1997), Standard practices for cycle counting in fatigue analysis, 2003.
    • Annual Book of ASTM Standards. Vol. 03.01, ASTM E 1049-85 (Reapproved 1997), Standard practices for cycle counting in fatigue analysis, 2003.
  • 18
    • 35348820512 scopus 로고    scopus 로고
    • th Electronic Components and Technology Conf, Reno, NV, May. 2007.
    • th Electronic Components and Technology Conf, Reno, NV, May. 2007.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.