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Volumn 556-557, Issue , 2007, Pages 541-544

The mechanism of interface state passivation by no

Author keywords

Interface; MOS; Nitridation; Oxide

Indexed keywords

ALUMINUM NITRIDE; INTERFACES (MATERIALS); MOLYBDENUM; NITRIDATION; OXIDES; PASSIVATION; SILICON CARBIDE;

EID: 35348878174     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/MSF.556-557.541     Document Type: Conference Paper
Times cited : (3)

References (9)
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    • J.M. Knaup et al.: Phys. Rev. B Vol. 71 (2005), p. 235321.
    • (2005) Phys. Rev. , vol.71 , pp. 235321
    • Knaup, J.M.1
  • 6
    • 29844450079 scopus 로고    scopus 로고
    • J.M. Knaup et al.: Phys. Rev. B Vol. 72 (2005), p. 115323.
    • (2005) Phys. Rev. , vol.72 , pp. 115323
    • Knaup, J.M.1
  • 7
    • 8744262961 scopus 로고    scopus 로고
    • H. Yano et al.: Mater. Sci. Forum. Vol. 457-460 (2004), p. 1333.
    • (2004) Mater. Sci. Forum , vol.457-460 , pp. 1333
    • Yano, H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.