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Volumn 46, Issue 10 A, 2007, Pages 6469-6473

Forward transfer of thin-film devices to flexible substrates by applying thermal stress

Author keywords

Germanium dioxide; High rate etching; Thermal stress; Transfer

Indexed keywords

ETCHING; HEAT TRANSFER; SEMICONDUCTING FILMS; SUBSTRATES; THERMAL STRESS;

EID: 35348877838     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.46.6469     Document Type: Article
Times cited : (8)

References (12)
  • 4
    • 32244433383 scopus 로고    scopus 로고
    • N. Karaki, T. Nanmoto, H. Ebihara, S. Inoue, and T. Shimoda: SID Int. Symp. Dig. Tech. Pap. 36 (2005) 1430.
    • N. Karaki, T. Nanmoto, H. Ebihara, S. Inoue, and T. Shimoda: SID Int. Symp. Dig. Tech. Pap. 36 (2005) 1430.
  • 5
    • 35348816803 scopus 로고    scopus 로고
    • A. Asano and T. Kinoshita: SID Int. Symp. Dig. Tech. Pap. 33 (2002) 1196.
    • A. Asano and T. Kinoshita: SID Int. Symp. Dig. Tech. Pap. 33 (2002) 1196.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.