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Volumn 7, Issue 9, 2007, Pages 2552-2558

Ultrafast Electron Microscopy (UEM): Four-dimensional imaging and diffraction of nanostructures during phase transitions

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION PATTERNS; ELECTRON MICROSCOPY; ELECTRONIC STRUCTURE; NANOSTRUCTURES; PHASE EQUILIBRIA; VANADIUM COMPOUNDS;

EID: 34948874898     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl071341e     Document Type: Article
Times cited : (68)

References (28)
  • 6
    • 34948827136 scopus 로고    scopus 로고
    • Method and system for ultrafast photoelectron microscope
    • US 7,154,091 B2, 20050401, 2006
    • Zewail, A.; Lobastov, V. Method and system for ultrafast photoelectron microscope. US 7,154,091 B2, 20050401, 2006.
    • Zewail, A.1    Lobastov, V.2
  • 19
    • 34948879292 scopus 로고    scopus 로고
    • Using a heat capacity of 60 J/molK,15 and knowing the molar mass of 82.9 g/mol (atomic weight, the density of 4.3 g/cm3, the and the pulse fluence at the sample and the absorption coefficient of 0.008 nm-1,20 we obtained <1 K. The heat diffusion constant (D, 0.02 cm2/s) was calculated from the thermal conductivity (70 mW/cmK15, density, and specific heat capacity heat capacity/molar mass
    • 15), density, and specific heat capacity (heat capacity/molar mass).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.