Influence of defects and processing parameters on the properties of indium tin oxide films on polyethylene napthalate substrate

Journal of Applied Physics

Volumn 102, Issue 6, 2007, Pages

  Han, H ^a   Zoo, Yeongseok ^a   Bhagat, S K ^a   Lewis, J S ^b   Alford, T L ^a  

^a ARIZONA STATE UNIVERSITY   (United States)

^b RTI INTERNATIONAL   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ARGON; INDIUM COMPOUNDS; POLYETHYLENES; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SPUTTER DEPOSITION; TIN OXIDES;

INDIUM TIN OXIDE (ITO); POLYETHYLENE NAPTHALATE; PROCESSING PARAMETERS; SUBSTRATE TEMPERATURES;

THIN FILMS;

EID: 34848833818     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2783952     Document Type: Article

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