메뉴 건너뛰기




Volumn 46, Issue 9 B, 2007, Pages 6135-6139

Double-patterning technique using plasma treatment of photoresist

Author keywords

Double patterning technique; Extremely low k1; Pattern decomposition; Plasma treatment technique; Si thin film passivation

Indexed keywords

ETCHING; PASSIVATION; PLASMA APPLICATIONS; THIN FILMS;

EID: 34648819081     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.46.6135     Document Type: Article
Times cited : (7)

References (12)
  • 12
    • 34648838040 scopus 로고    scopus 로고
    • ITRS International Technology Roadmap for Semiconductors
    • ITRS International Technology Roadmap for Semiconductors, http:// pub.lic.itrs.net/


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.