High read stability and low leakage cache memory cell

Proceedings - IEEE International Symposium on Circuits and Systems

Volumn , Issue , 2007, Pages 2774-2777

  Liu, Zhiyu ^a   Kursun, Volkan ^a  

^a Wisconsin Electric Machines and Power Electronics Consortium   (United States)

Author keywords

Low leakage; Noise immunity; Process variations; Read stability; SRAM; Static noise margin

Indexed keywords

CONVERGENCE OF NUMERICAL METHODS; ELECTRIC POWER UTILIZATION; LEAKAGE CURRENTS; STATIC RANDOM ACCESS STORAGE;

LEAKAGE POWER CONSUMPTION; NOISE IMMUNITY; PROCESS VARIATIONS; READ STABILITY; STATIC NOISE MARGIN;

CACHE MEMORY;

EID: 34548828285     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/iscas.2007.378628     Document Type: Conference Paper

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