Microstructure and electric properties of (104)/(014)-oriented Bi3.15Nd0.85Ti3O12 films on Pt (111)/Ti/SiO2/Si by sol-gel method

Materials Letters

Volumn 61, Issue 27, 2007, Pages 4897-4900

  Chen, X Q ^a   Qiao, Y ^b   Liu, X L ^a   Lu, C J ^a   Le Rhun, Gwenael ^c   Senz, Stephan ^c   Hesse, Dietrich ^c  

^a HUBEI UNIVERSITY   (China)

^b JIANGHAN UNIVERSITY   (China)

^c MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

Author keywords

Ferroelectrics; Orientation; Piezoelectricity; Thin film

Indexed keywords

BISMUTH COMPOUNDS; ELECTRIC PROPERTIES; GRAIN SIZE AND SHAPE; MICROSTRUCTURE; PIEZOELECTRICITY; SOL-GEL PROCESS; THIN FILMS;

COLUMNAR GRAINS; PIEZOELECTRIC COEFFICIENT; X-RAY POLE FIGURE;

FERROELECTRIC MATERIALS;

EID: 34548778149     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matlet.2007.03.106     Document Type: Article

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