Communication-centric SoC debug using transactions

Proceedings - 12th IEEE European Test Symposium, ETS 2007

Volumn , Issue , 2007, Pages 69-74

  Vermeulen, Bart ^a   Goossens, Kees ^a,b   Van Steeden, Remco ^c   Bennebroek, Martijn ^d  

^a NXP SEMICONDUCTORS   (Netherlands)

^b DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^c UNIVERSITY OF TWENTE   (Netherlands)

^d PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL COMPLEXITY; ERROR ANALYSIS; INTEGRATED CIRCUIT TESTING; PROGRAM DEBUGGING; PROGRAMMABLE LOGIC CONTROLLERS;

COMMUNICATION INFRASTRUCTURE; NETWORK-ON-CHIP; SYSTEM-ON-CHIP COMPLEXITY;

CHIP SCALE PACKAGES;

EID: 34548754565     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ETS.2007.14     Document Type: Conference Paper

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