NoC monitoring: Impact on the design flow

Proceedings - IEEE International Symposium on Circuits and Systems

Volumn , Issue , 2006, Pages 1981-1984

  Ciordas, Calin ^a   Goossens, Kees ^b   Radulescu, Andrei ^b   Basten, Twan ^a  

^a EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

COST REDUCTION; EMBEDDED SYSTEMS; INTRUSION DETECTION; MICROPROCESSOR CHIPS; PROBLEM SOLVING; PRODUCT DESIGN; REUSABILITY; TELECOMMUNICATION TRAFFIC;

DESIGN FLOW; NETWORKS-ON-CHIP (NOC);

INTERCONNECTION NETWORKS;

EID: 34547268023     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (19)

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