Structural, morphological and local electric properties of TiO2 thin films grown by pulsed laser deposition

Journal of Physics D: Applied Physics

Volumn 40, Issue 17, 2007, Pages 5246-5251

  Gyorgy E ^a,b   Perez Del Pino A ^a   Sauthier, G ^a,b   Figueras, A ^a,b   Alsina, F ^b,c   Pascual, J ^b,c  

^a INSTITUT DE CIÈNCIA DE MATERIALS DE BARCELONA ICMAB CSIC   (Spain)

^b CSIC   (Spain)

^c UNIVERSITAT AUTÒNOMA DE BARCELONA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHEMICAL SENSORS; CRYSTALLIZATION; ELECTRIC PROPERTIES; FILM GROWTH; IRRADIATION; LASERS; PHOTOCATALYSTS; PULSED LASER DEPOSITION; RAMAN SPECTROSCOPY; SILICON; SUBSTRATES; SURFACE MORPHOLOGY; TITANIUM DIOXIDE; X RAY DIFFRACTION ANALYSIS;

CONTROLLED OXYGEN ATMOSPHERE; CURRENT SENSING ATOMIC FORCE MICROSCOPY; MICRO-RAMAN SPECTROSCOPY; NANO-SCALE ELECTRIC PROPERTIES; SOLAR ENERGY CONVERTERS;

THIN FILMS;

EID: 34548694288     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/40/17/035     Document Type: Article

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