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Journal of Applied Physics

Volumn 102, Issue 5, 2007, Pages

Inversion layer formation in organic field-effect devices

(2) Lindner, Th a Paasch, G a

a IFW DRESDEN (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE MEASUREMENT; COMPUTER SIMULATION; HYSTERESIS; MICROELECTRONICS; MICROPROCESSOR CHIPS; MOS CAPACITORS;

DRAIN CONTACTS; INVERSION LAYERS; METALLIC SOURCES; POLYMER ELECTRONICS;

FIELD EFFECT TRANSISTORS;

EID: 34548612596 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.2776235 Document Type: Article

Times cited : (20)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.