Substrate effect on the output conductance frequency response of SOI MOSFETs

NATO Security through Science Series C: Environmental Security

Volumn , Issue , 2007, Pages 221-238

  Kilchytska, Valeria ^a   Levacq, David ^a   Lederer, Dimitri ^a   Pailloncy, Guillaume ^a   Raskin, Jean Pierre ^a   Flandre, Denis ^a  

^a UNIVERSITÉ CATHOLIQUE DE LOUVAIN   (Belgium)

Author keywords

Device scaling; Device simulation; Frequency response; Output conductance; SOI MOSFETs

Indexed keywords

EID: 34548461717     PISSN: 18714668     EISSN: None     Source Type: Book Series    
DOI: 10.1007/978-1-4020-6380-0_16     Document Type: Conference Paper

References (15)

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