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Physica C: Superconductivity and its Applications

Volumn 432, Issue 3-4, 2005, Pages 147-152

Effect of annealing time on the structure and properties of YBCO films by the TFA-MOD method

(6) Cui, X M a,b Tao, B W a Xiong, J a Liu, X Z a Zhu, J a Li, Y R a

a UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA (China)

b PANZHIHUA UNIVERSITY (China)

Author keywords

Annealing time; TFA MOD; YBCO film

Indexed keywords

ANNEALING; IMPURITIES; MICROSTRUCTURE; SCANNING ELECTRON MICROSCOPY; SURFACE ROUGHNESS; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

ANNEALING TIME; TFA-MOD; YBCO FILMS;

YTTRIUM BARIUM COPPER OXIDES;

EID: 28144447859 PISSN: 09214534 EISSN: None Source Type: Journal
DOI: 10.1016/j.physc.2005.08.001 Document Type: Article

Times cited : (19)

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