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Volumn 91, Issue 9, 2007, Pages
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Variation in lattice parameters of 6H-SiC irradiated to extremely low doses
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Author keywords
[No Author keywords available]
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Indexed keywords
DOSIMETRY;
IRRADIATION;
LATTICE CONSTANTS;
SILICON CARBIDE;
X RAY DIFFRACTION;
BASAL PLANE;
HIGH RESOLUTION X RAY DIFFRACTION;
UNIT CELLS;
VOLUMETRIC CONTRACTION;
SINGLE CRYSTALS;
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EID: 34548438080
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.2778630 Document Type: Article |
Times cited : (22)
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References (17)
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